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An Effective Curve Matching Metric for Parameter Identification using Partial Mapping

This paper describes a new method for curve matching essential to the solution of inverse problems represented by system parameter identification. Hysteretic response curves are specifically addressed as a general class. The method is based on Partial Curve Mapping (PCM) of the experiment curve onto the computed curve. This methodology involves a curve matching metric which is computed using the volume between the test curve and the computed curve section. A number of examples are presented to demonstrate the capability. These examples represent hysteretic curves which are impossible to match without mapping.